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TP274

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    Abstract:

    A shape measurement based on ESPI by using carrier is presented. When the tested object is tilted with a small angle,the carrier pattern containing altitude information is formed on the object surface. By using the carrier pattern captured by a CCD camera,the phase of the object can be derived by Fourier transform and the shape measurement is realized. The principle of the method is introduced and proved by an experiment.

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.[J]. Optoelectronics Letters,2008,4(3):

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