| LI Zheng-ya,WANG Xiang-hui,FAN Fei,CHENG Jie-rong,CHANG Sheng-jiang.Resolution and contrast enhancement in optical sub-traction microscopy with annular aperture[J].Optoelectronics Letters,2019,15(2):93-97 |
| Resolution and contrast enhancement in optical sub-traction microscopy with annular aperture |
| Author Name | Affiliation | | LI Zheng-ya | Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China | | WANG Xiang-hui | Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China | | FAN Fei | Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China | | CHENG Jie-rong | Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China | | CHANG Sheng-jiang | Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Institute of Modern Optics, Nankai University, Tianjin 300350, China |
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| Abstract: |
| A method for improving lateral resolution and reducing imaging distortion of optical subtraction microscopy is proposed. First, an azimuthally polarized (AP) light is modulated by an annular aperture. Then, an image with higher lateral resolu-tion is obtained by subtracting an image obtained by an annular AP beam from an image obtained by a radially polarized beam. The simulation results demonstrate that compared with the case without the annular aperture, negative side-lobes in the effective point spread function are effectively suppressed, and the imaging quality of subtraction microscopy is obvi-ously enhanced. |
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