Design and analysis for a high-accuracy CCD
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

TN386.5

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    In order to improve the test accuracy of CCD,a new type of CCD device is proposed.Several columns(rows) of photoelectric diodes(PDs) are combined together,and staggered with the distance of H1=H/N,where H is the space between two adjacent PDs,and N is the number of columns(rows).The photoelectric signals are collected simultaneously by multi-channel A/D,and the accurate measurement result is obtained through appropriate signal processing.Without changing the size or space of PDs,more photographi...

    Reference
    Related
    Cited by
Get Citation

WANG He-shun, ZHU Wei-bing, WANG Qiang, CHEN Ci-chang. Design and analysis for a high-accuracy CCD[J]. Optoelectronics Letters,2011,7(3):167-170

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:
  • Revised:
  • Adopted:
  • Online:
  • Published:
Article QR Code